The LSP-X series of Analog Scanning CMM Probes from Leitz represent state-of-the art features and performance. Coupled with a CAD-enabled software such as PC-DMIS, data can be analyzed as a comparison of actual scan data to the CAD model.
LSP-X1s, LSP-X1m Probes - A compact high accuracy and high performance 3D analog scanning probe. Rapidly collect thousands of data points for complete and precise part features including form, location and size. The probe supports Single Point Probing, Continuous and High-Speed Scanning, and Self-Centering modes.
LSP-X1c Probe Head - A small outer diameter allows measurements deep inside the workpiece. The probe supports Single Point Probing, Continuous and High-Speed Scanning, and Self-Centering modes.
LSP-X3c Probe Head - A fixed analog scanning probe, it offers effective Single Point Probing as well as continuous High-Speed Scanning. The probe is able to scan complex geometric elements such as cylinders, worm gears, turbine blades, and worm screws.
Probing System Configuration Charts:
